The FeSe 2 nanospheres were thoroughly characterized using TEM, EDX, and XRD. We conducted the TEM analysis using the Tecnai G2 20 instrument (FEI, Germany). Prior to any characterizations, we ...
Fitting of full X-ray diffraction patterns is an effective method for quantifying abundances during X-ray diffraction (XRD) analyses. The method is based on the principal that the observed diffraction ...
Gerdau S/A Ord-1.49% R$34.13B ...
After hours: February 7 at 8:00:00 PM EST Loading Chart for X ...
Episode • 1 Hr 26 Mins • 07 JAN • The Ray D'Arcy Show "It's the most important book I've ever published, to me emotionally." Jamie Oliver … ...
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