The Electron Imaging and Holography Facility has become the Helium Ion Microscopy Facility. Two of the previous major microscopes (SEM/FIB and Tecnai F20) were sold or retired. The feasibility of ...

Helium ion microscopy (HIM) and focused ion beam (FIB) technologies are at the forefront of advanced material characterization and fabrication. These techniques allow scientists to analyze ...

Neutral helium microscopy (NHM), also known as scanning helium microscopy (SHeM), is an innovative imaging technique that utilizes a beam of neutral helium atoms to probe surfaces at an atomic level.

Everhart Thornley secondary electron detector Electron flood gun for charge compensation 5 axis motorized stage transmission camera (Medipix 256 x 256 pixels 55 microns, avalanche photodiode array) ...